Anne is an engineer with wide experience in Analog test and DFT. Anne has tackled problems in IO test strategy, PLL test, analog fault modeling, statistical analysis of test data, manufacturing process instrumentation to gather relevant data, strategic influence of design and test teams for manufacturing optimization, and has been a mentor to others for both technical skills and career growth. Anne approaches her work with passion; she cares about the people she works with and the technical results. She has won two Best of ITC (IEEE International Test Conference) awards for her work, and has maintained industry involvement in her fields of expertise. I would recommend her for a job where these skills can be applied.